The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Conscient du pouvoir XLe remplissage est une approche préférable pour éviter la perte de rendement induite par les chutes IR lors des tests de numérisation à grande vitesse. Cependant, la capacité des précédents XLes méthodes de remplissage visant à réduire l'activité de commutation de lancement peuvent s'avérer insatisfaisantes, en raison d'un faible effet (réduction insuffisante et globale uniquement) et/ou d'une faible évolutivité (long temps CPU). Cet article aborde ce problème de qualité de réduction avec un nouvel algorithme GA (algorithme génétique) basé sur X-méthode de remplissage, appelée GA-fill. Ses objectifs sont (1) d'atteindre à la fois l'efficacité et l'évolutivité de manière plus équilibrée et (2) de concentrer davantage l'effet de réduction de l'activité de commutation de lancement sur les zones critiques qui ont un impact plus élevé sur la perte de rendement induite par les chutes IR. Des expériences d'évaluation sont en cours sur des circuits de référence et industriels, et les résultats ont démontré l'utilité du GA-fill.
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Yuta YAMATO, Xiaoqing WEN, Kohei MIYASE, Hiroshi FURUKAWA, Seiji KAJIHARA, "A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing" in IEICE TRANSACTIONS on Information,
vol. E94-D, no. 4, pp. 833-840, April 2011, doi: 10.1587/transinf.E94.D.833.
Abstract: Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E94.D.833/_p
Copier
@ARTICLE{e94-d_4_833,
author={Yuta YAMATO, Xiaoqing WEN, Kohei MIYASE, Hiroshi FURUKAWA, Seiji KAJIHARA, },
journal={IEICE TRANSACTIONS on Information},
title={A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing},
year={2011},
volume={E94-D},
number={4},
pages={833-840},
abstract={Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.},
keywords={},
doi={10.1587/transinf.E94.D.833},
ISSN={1745-1361},
month={April},}
Copier
TY - JOUR
TI - A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
T2 - IEICE TRANSACTIONS on Information
SP - 833
EP - 840
AU - Yuta YAMATO
AU - Xiaoqing WEN
AU - Kohei MIYASE
AU - Hiroshi FURUKAWA
AU - Seiji KAJIHARA
PY - 2011
DO - 10.1587/transinf.E94.D.833
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E94-D
IS - 4
JA - IEICE TRANSACTIONS on Information
Y1 - April 2011
AB - Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.
ER -