The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Dans cet article, nous présentons une technique de test de balayage efficace à faible consommation qui réduit simultanément la consommation d'énergie moyenne et maximale. Le schéma d'activation sélective de la chaîne de balayage supprime l'utilisation inutile de la chaîne de balayage pendant les opérations de décalage de balayage et de capture. La réorganisation statistique des cellules d’analyse permet une suppression efficace de la chaîne d’analyse. Les résultats expérimentaux ont démontré que la méthode proposée réduit constamment la consommation d’énergie moyenne et maximale lors des tests de numérisation.
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Yongjoon KIM, Jaeseok PARK, Sungho KANG, "A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 1, pp. 193-196, January 2010, doi: 10.1587/transinf.E93.D.193.
Abstract: In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.193/_p
Copier
@ARTICLE{e93-d_1_193,
author={Yongjoon KIM, Jaeseok PARK, Sungho KANG, },
journal={IEICE TRANSACTIONS on Information},
title={A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption},
year={2010},
volume={E93-D},
number={1},
pages={193-196},
abstract={In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.},
keywords={},
doi={10.1587/transinf.E93.D.193},
ISSN={1745-1361},
month={January},}
Copier
TY - JOUR
TI - A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
T2 - IEICE TRANSACTIONS on Information
SP - 193
EP - 196
AU - Yongjoon KIM
AU - Jaeseok PARK
AU - Sungho KANG
PY - 2010
DO - 10.1587/transinf.E93.D.193
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 1
JA - IEICE TRANSACTIONS on Information
Y1 - January 2010
AB - In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.
ER -