The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Un nouveau modèle de mésappariement analogique au niveau du circuit a été développé. Les paramètres des petits signaux du transistor MOS sont modélisés en termes de caractère d'adaptation pour les opérations d'inversion forte et faible. L'analyse des disparités sur les amplificateurs CMOS de base est effectuée avec le modèle proposé et les simulations Monte Carlo SPICE. Nous avons réussi à dériver une formule analytique simple sur l'inadéquation des performances des circuits CMOS analogiques, dont la précision a été vérifiée en utilisant la conception réelle des circuits analogiques, avec une erreur moyenne inférieure à 10 %.
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Hiroo MASUDA, Takeshi KIDA, Shin-ichi OHKAWA, "Comprehensive Matching Characterization of Analog CMOS Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 4, pp. 966-975, April 2009, doi: 10.1587/transfun.E92.A.966.
Abstract: A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.966/_p
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@ARTICLE{e92-a_4_966,
author={Hiroo MASUDA, Takeshi KIDA, Shin-ichi OHKAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Comprehensive Matching Characterization of Analog CMOS Circuits},
year={2009},
volume={E92-A},
number={4},
pages={966-975},
abstract={A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.},
keywords={},
doi={10.1587/transfun.E92.A.966},
ISSN={1745-1337},
month={April},}
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TY - JOUR
TI - Comprehensive Matching Characterization of Analog CMOS Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 966
EP - 975
AU - Hiroo MASUDA
AU - Takeshi KIDA
AU - Shin-ichi OHKAWA
PY - 2009
DO - 10.1587/transfun.E92.A.966
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2009
AB - A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.
ER -