The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Les FPGA qui exploitent des via-switches, qui sont des sortes de RAM résistives non volatiles, pour la mise en œuvre de barres croisées attirent l'attention en raison de leur densité d'intégration élevée et de leur efficacité énergétique. La barre transversale du commutateur via est responsable du routage du signal dans les interconnexions en modifiant les états marche/arrêt des commutateurs via. Pour vérifier la fonctionnalité de la barre transversale des via-switchs après la fabrication, des tests de défauts qui vérifient si nous pouvons normalement allumer/éteindre les via-switchs sont essentiels. Cet article confirme qu'un comparateur différentiel général de paires discrimine avec succès les états marche/arrêt des commutateurs via, et clarifie les modes de défaut d'un commutateur via par simulation SPICE au niveau du transistor qui injecte des défauts bloqués sur/off au commutateur atomique et à la varistance, où un via-switch se compose de deux commutateurs atomiques et de deux varistances. Nous proposons ensuite une méthodologie de diagnostic de défauts pour les via-switches dans la barre transversale qui diagnostique les modes de défaut en fonction de la différence de réponse du comparateur entre les via-switchs normaux et défectueux. La méthode proposée permet d'obtenir une détection de défaut à 100 % en vérifiant les réponses du comparateur après avoir activé/désactivé le via-switch. Dans le cas où le nombre de composants défectueux dans un via-switch est de un, le rapport du diagnostic de défaut, qui identifie exactement la varistance et le commutateur atomique défectueux à l'intérieur du via-switch défectueux, est de 100 %, et dans le cas d'un maximum de deux défauts, le taux de diagnostic des défauts est de 79 %.
Ryutaro DOI
Osaka University
Xu BAI
NEC Corporation
Toshitsugu SAKAMOTO
NEC Corporation
Masanori HASHIMOTO
Osaka University
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copier
Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, "A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 12, pp. 1447-1455, December 2020, doi: 10.1587/transfun.2020VLP0005.
Abstract: FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2020VLP0005/_p
Copier
@ARTICLE{e103-a_12_1447,
author={Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA},
year={2020},
volume={E103-A},
number={12},
pages={1447-1455},
abstract={FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.},
keywords={},
doi={10.1587/transfun.2020VLP0005},
ISSN={1745-1337},
month={December},}
Copier
TY - JOUR
TI - A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1447
EP - 1455
AU - Ryutaro DOI
AU - Xu BAI
AU - Toshitsugu SAKAMOTO
AU - Masanori HASHIMOTO
PY - 2020
DO - 10.1587/transfun.2020VLP0005
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2020
AB - FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
ER -