The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
L'utilisation du rang de colonne de la matrice de sensibilité du système comme mesure de testabilité pour les défauts paramétriques dans les circuits analogiques linéaires a été lancée par Sen et Saeks dans les années 1970, puis réintroduite par plusieurs autres. Son utilisation pratique a été limitée par la manière dont il peut être calculé. Les algorithmes numériques souffrent d’inévitables erreurs d’arrondi, alors que les techniques symboliques traditionnelles ne peuvent gérer que de très petits circuits. Dans cet article, une méthode efficace est présentée pour l'analyse de la testabilité analogique de Sen et Saeks. Le procédé utilise une analyse de circuit symbolique basée sur un diagramme de décision déterminant. Les résultats expérimentaux ont démontré que la nouvelle méthode est capable de gérer des circuits analogiques beaucoup plus grands.
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Tao PI, Chuan-Jin Richard SHI, "Testability Analysis of Analog Circuits via Determinant Decision Diagrams" in IEICE TRANSACTIONS on Fundamentals,
vol. E83-A, no. 12, pp. 2608-2615, December 2000, doi: .
Abstract: The use of the column-rank of the system sensitivity matrix as a testability measure for parametric faults in linear analog circuits was pioneered by Sen and Saeks in 1970s, and later re-introduced by several others. Its practical use has been limited by how it can be calculated. Numerical algorithms suffer from inevitable round-off errors, while traditional symbolic techniques can only handle very small circuits. In this paper, an efficient method is introduced for the analysis of Sen and Saeks' analog testability. The method employs determinant decision diagram based symbolic circuit analysis. Experimental results have demonstrated the new method is capable of handling much larger analog circuits.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e83-a_12_2608/_p
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@ARTICLE{e83-a_12_2608,
author={Tao PI, Chuan-Jin Richard SHI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Testability Analysis of Analog Circuits via Determinant Decision Diagrams},
year={2000},
volume={E83-A},
number={12},
pages={2608-2615},
abstract={The use of the column-rank of the system sensitivity matrix as a testability measure for parametric faults in linear analog circuits was pioneered by Sen and Saeks in 1970s, and later re-introduced by several others. Its practical use has been limited by how it can be calculated. Numerical algorithms suffer from inevitable round-off errors, while traditional symbolic techniques can only handle very small circuits. In this paper, an efficient method is introduced for the analysis of Sen and Saeks' analog testability. The method employs determinant decision diagram based symbolic circuit analysis. Experimental results have demonstrated the new method is capable of handling much larger analog circuits.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - Testability Analysis of Analog Circuits via Determinant Decision Diagrams
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2608
EP - 2615
AU - Tao PI
AU - Chuan-Jin Richard SHI
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E83-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2000
AB - The use of the column-rank of the system sensitivity matrix as a testability measure for parametric faults in linear analog circuits was pioneered by Sen and Saeks in 1970s, and later re-introduced by several others. Its practical use has been limited by how it can be calculated. Numerical algorithms suffer from inevitable round-off errors, while traditional symbolic techniques can only handle very small circuits. In this paper, an efficient method is introduced for the analysis of Sen and Saeks' analog testability. The method employs determinant decision diagram based symbolic circuit analysis. Experimental results have demonstrated the new method is capable of handling much larger analog circuits.
ER -