The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Une terminaison à ondes millimétriques tolérante à l'erreur de résistance du film résistif intégré dans un substrat LTCC multicouche a été développée. La tolérance à l'erreur de résistance peut être obtenue en utilisant deux lignes de bandes bifurquées se chevauchant avec le film résistif, dont les longueurs sont différentes l'une de l'autre. Il a été démontré expérimentalement que la configuration de terminaison proposée est efficace pour améliorer la tolérance aux erreurs de résistance du film résistif intégré dans le substrat LTCC.
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Takeshi YUASA, Yukihiro TAHARA, Naofumi YONEDA, Hideyuki OH-HASHI, "A Millimeter-Wave Resistance Error Tolerant Termination in Multi-Layered LTCC Substrate" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 3, pp. 321-326, March 2011, doi: 10.1587/transele.E94.C.321.
Abstract: A millimeter-wave termination which is tolerant to the resistance error of the embedded resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be accomplished using two bifurcated strip lines overlapping with the resistive film, whose lengths are different form each other. It has been experimentally demonstrated that the proposed termination configuration is effective to enhance the tolerance to resistance error of the embedded resistive film in the LTCC substrate.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.321/_p
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@ARTICLE{e94-c_3_321,
author={Takeshi YUASA, Yukihiro TAHARA, Naofumi YONEDA, Hideyuki OH-HASHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Millimeter-Wave Resistance Error Tolerant Termination in Multi-Layered LTCC Substrate},
year={2011},
volume={E94-C},
number={3},
pages={321-326},
abstract={A millimeter-wave termination which is tolerant to the resistance error of the embedded resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be accomplished using two bifurcated strip lines overlapping with the resistive film, whose lengths are different form each other. It has been experimentally demonstrated that the proposed termination configuration is effective to enhance the tolerance to resistance error of the embedded resistive film in the LTCC substrate.},
keywords={},
doi={10.1587/transele.E94.C.321},
ISSN={1745-1353},
month={March},}
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TY - JOUR
TI - A Millimeter-Wave Resistance Error Tolerant Termination in Multi-Layered LTCC Substrate
T2 - IEICE TRANSACTIONS on Electronics
SP - 321
EP - 326
AU - Takeshi YUASA
AU - Yukihiro TAHARA
AU - Naofumi YONEDA
AU - Hideyuki OH-HASHI
PY - 2011
DO - 10.1587/transele.E94.C.321
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2011
AB - A millimeter-wave termination which is tolerant to the resistance error of the embedded resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be accomplished using two bifurcated strip lines overlapping with the resistive film, whose lengths are different form each other. It has been experimentally demonstrated that the proposed termination configuration is effective to enhance the tolerance to resistance error of the embedded resistive film in the LTCC substrate.
ER -