The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Un nouveau système CAT (Computer-Aided-Testing) sur plaquette à ondes millimétriques a été développé pour la mesure des paramètres S et du NF (niveau de bruit). Pour le système de test des paramètres S, nous avons développé une configuration de support et l'avons installée dans une sonde de plaquette semi-automatique afin que le module T/R basé sur un guide d'ondes puisse être directement connecté à une tête de sonde via des guides d'ondes fixes, qui présentent une faible perte d'insertion inférieure à 2 dB, de 75 GHz à 98 GHz. La précision du système de test développé a été confirmée en mesurant, avec ce système, un motif court décalé coplanaire, puis en comparant les résultats mesurés et simulés. Un bon accord entre les valeurs mesurées et calculées, tant dans la perte de retour que dans la phase de retour, a démontré avec succès la supériorité du système. Un système de test NF en bande W avec un bruit système inférieur à 8 dB a également été développé pour fournir une capacité de mesure NF sur plaquette avec une précision de
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Takayuki KATOH, Takuo KASHIWA, Hiroyuki HOSHI, Akira INOUE, Takahide ISHIKAWA, "Automated Millimeter-Wave On-Wafer Testing System" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 7, pp. 1312-1317, July 1999, doi: .
Abstract: A novel millimeter-wave on-wafer CAT(Computer-Aided-Testing ) system has been developed for measurement of S-parameters and NF ( Noise figure ). For the S-parameter test system, we have developed a holder setup and installed it in a semi-automatic wafer prober so that the waveguide-based T/R module can be directly connected to a probe-head through fixed waveguides, which feature low insertion loss of less than 2 dB, from 75 GHz to 98 GHz. The accuracy of the developed test system was confirmed by measuring, with this system, a co-planar offset short pattern then comparing measured and simulated results. A good agreement between the measured and calculated, in both return loss and return phase successfully demonstrated the superiority of the system. A W-band NF test system with a system noise of less than 8 dB has been also developed to provide an on-wafer NF measurement capability with an accuracy of
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_7_1312/_p
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@ARTICLE{e82-c_7_1312,
author={Takayuki KATOH, Takuo KASHIWA, Hiroyuki HOSHI, Akira INOUE, Takahide ISHIKAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Automated Millimeter-Wave On-Wafer Testing System},
year={1999},
volume={E82-C},
number={7},
pages={1312-1317},
abstract={A novel millimeter-wave on-wafer CAT(Computer-Aided-Testing ) system has been developed for measurement of S-parameters and NF ( Noise figure ). For the S-parameter test system, we have developed a holder setup and installed it in a semi-automatic wafer prober so that the waveguide-based T/R module can be directly connected to a probe-head through fixed waveguides, which feature low insertion loss of less than 2 dB, from 75 GHz to 98 GHz. The accuracy of the developed test system was confirmed by measuring, with this system, a co-planar offset short pattern then comparing measured and simulated results. A good agreement between the measured and calculated, in both return loss and return phase successfully demonstrated the superiority of the system. A W-band NF test system with a system noise of less than 8 dB has been also developed to provide an on-wafer NF measurement capability with an accuracy of
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - Automated Millimeter-Wave On-Wafer Testing System
T2 - IEICE TRANSACTIONS on Electronics
SP - 1312
EP - 1317
AU - Takayuki KATOH
AU - Takuo KASHIWA
AU - Hiroyuki HOSHI
AU - Akira INOUE
AU - Takahide ISHIKAWA
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 1999
AB - A novel millimeter-wave on-wafer CAT(Computer-Aided-Testing ) system has been developed for measurement of S-parameters and NF ( Noise figure ). For the S-parameter test system, we have developed a holder setup and installed it in a semi-automatic wafer prober so that the waveguide-based T/R module can be directly connected to a probe-head through fixed waveguides, which feature low insertion loss of less than 2 dB, from 75 GHz to 98 GHz. The accuracy of the developed test system was confirmed by measuring, with this system, a co-planar offset short pattern then comparing measured and simulated results. A good agreement between the measured and calculated, in both return loss and return phase successfully demonstrated the superiority of the system. A W-band NF test system with a system noise of less than 8 dB has been also developed to provide an on-wafer NF measurement capability with an accuracy of
ER -