The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Après une brève discussion des exigences en matière de maillage pour la simulation de processus et de dispositifs semi-conducteurs, nous présentons une technique de raffinement de Delaunay tridimensionnelle combinée à un algorithme de front avançant modifié.
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Peter FLEISCHMANN, Wolfgang PYKA, Siegfried SELBERHERR, "Mesh Generation for Application in Technology CAD" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 6, pp. 937-947, June 1999, doi: .
Abstract: After a brief discussion of the demands in meshing for semiconductor process and device simulation, we present a three-dimensional Delaunay refinement technique combined with a modified advancing front algorithm.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_6_937/_p
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@ARTICLE{e82-c_6_937,
author={Peter FLEISCHMANN, Wolfgang PYKA, Siegfried SELBERHERR, },
journal={IEICE TRANSACTIONS on Electronics},
title={Mesh Generation for Application in Technology CAD},
year={1999},
volume={E82-C},
number={6},
pages={937-947},
abstract={After a brief discussion of the demands in meshing for semiconductor process and device simulation, we present a three-dimensional Delaunay refinement technique combined with a modified advancing front algorithm.},
keywords={},
doi={},
ISSN={},
month={June},}
Copier
TY - JOUR
TI - Mesh Generation for Application in Technology CAD
T2 - IEICE TRANSACTIONS on Electronics
SP - 937
EP - 947
AU - Peter FLEISCHMANN
AU - Wolfgang PYKA
AU - Siegfried SELBERHERR
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1999
AB - After a brief discussion of the demands in meshing for semiconductor process and device simulation, we present a three-dimensional Delaunay refinement technique combined with a modified advancing front algorithm.
ER -