The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Nous proposons un capteur d'image CMOS qui réalise une imagerie à large plage dynamique et une représentation non linéaire des caractéristiques d'E/S. Le capteur d'image proposé contrôle le temps d'intégration pour chaque pixel en fonction de la répartition de la luminosité des objets. L'histogramme à la fin de l'intégration est estimé à partir des premières valeurs intermédiaires de la photodiode qui sont lues sur un circuit externe. À l'aide de l'histogramme estimé, les paramètres d'imagerie, qui contrôlent le temps d'intégration pixel par pixel, sont optimisés dans le circuit externe. Selon les paramètres d'imagerie, la valeur intermédiaire de la photodiode est comparée au seuil et réinitialisée à la valeur de départ en fonction du résultat de la comparaison. Ces processus se répètent plusieurs fois. A la fin de l'intégration, la valeur de la photodiode est reconstruite en utilisant les paramètres d'imagerie. Ensuite, des images à large plage dynamique avec des caractéristiques d’E/S adaptées sont obtenues. Nous avons fabriqué un prototype d'une taille de 64
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copier
Satoko KAGAMI, Fumitsugu SUZUKI, Takayuki HAMAMOTO, "Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 9, pp. 1402-1408, September 2008, doi: 10.1093/ietele/e91-c.9.1402.
Abstract: We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.9.1402/_p
Copier
@ARTICLE{e91-c_9_1402,
author={Satoko KAGAMI, Fumitsugu SUZUKI, Takayuki HAMAMOTO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects},
year={2008},
volume={E91-C},
number={9},
pages={1402-1408},
abstract={We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
keywords={},
doi={10.1093/ietele/e91-c.9.1402},
ISSN={1745-1353},
month={September},}
Copier
TY - JOUR
TI - Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects
T2 - IEICE TRANSACTIONS on Electronics
SP - 1402
EP - 1408
AU - Satoko KAGAMI
AU - Fumitsugu SUZUKI
AU - Takayuki HAMAMOTO
PY - 2008
DO - 10.1093/ietele/e91-c.9.1402
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2008
AB - We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
ER -